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Don't Let Your ADAS Chips Crash! Test Them!

NOV
12
2019
12. NOV 2019

Presentation Halle ICM - Internationales Congress Center München SEMICON EUROPA > Advanced Packaging Conference > Session 2: Test and Reliability I

14:55-15:20 Uhr | ICM - Internationales Congress Center München ICM Room 13b, 1st Floor

Themen: SEMICON EUROPA

Chairman: Peter Cockburn (, Cohu, Inc., ISG)

Format: Presentation

Sprache: Englisch

Through integration and evolution, automotive features such as cruise control, parking sensors, dashboard cameras, engine temperature monitors, tire pressure monitoring systems and others have significantly improved driver, passenger and pedestrian safety. More recently, advanced driver assistance systems (ADAS) have moved from fiction to fruition through extensive research, elaborate trials and 1855development efforts. The success and potential of ADAS, has been the catalyst that triggered human belief that we can move from "less-driver cars" to "driverless cars" commonly known as autonomous vehicles (AVs).While AVs utilize the information provided by ADAS, they expand the information scope by using an eclectic range of ADAS sensors. Sensors gather similar environmental and situational information (internal and/or external to the vehicle) from different points of view. These differing captures offer both information uniqueness and redundancy allowing the system to make well-informed decisions which ensure driver, passenger and pedestrian safety.AVs success and ability to avoid accidents relies on the success of their ADAS building blocks, which in turn rely on the testing quality that certifies each ADAS sub-system. As the name implies, ADAS is a system and therefore requires each of its individual components to be tested initially on a unit level and the integrated product at a system level. Unit-level tests verify parametric and performance-related specifications, while the system-level testing verifies hardware and software integration of the sensors with the computational engine. Utilizing publicly available information from the leading ADAS suppliers, this presentation will explore testing the vision aspect of ADAS focusing on radar, LiDAR, camera modules and computing engines. It will address the wafer test, partially assembled test, final test and system-level tests. Testing is an essential part of the quest for crash avoidance.

Informationen

Gerard John

Gerard joined Amkor in 2005, and has supported and managed hardware and software test development fora variety of Amkor packaging. He currently serves as an advanced test technical expert for MEMS, 2.5D,WLFO, HDFO, fine pitch probe and optical devices, supporting customers in the US and Europe. Prior tojoining Amkor, Gerard worked in various semiconductor test positions for Conexant Systems, FlarionTechnologies (acquired by Qualcomm) and Motorola. He holds a BA degree in electronics andtelecommunications engineering from Osmania University and an MBA from Gainey School of Business inMichigan.He holds multiple patents in the field of MEMS Test

Gerard John
Sr Director Advanced Test

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