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Vortrag PCB & EMS Speakers Corner
11:00-11:30 Uhr | PCB & EMS Speakers Corner, B3, booth 360
Themen: Mess- und Prüftechnik, QualitätssicherungSprecher: Freddy Gilbert (ZESTRON Europe ...a Business Division of Dr. O.K. Wack Chemie GmbH)
Smaller and smaller components are now equipping electronic assemblies. While component size minimization increased the functionality of small electronic assemblies, it has also led to a reduction of the standoff under components. Consequently, an optical cleanliness inspection under these components is becoming either challenging or even impossible. Notwithstanding, cleanliness control of electronic assemblies remains necessary. A sufficient cleanliness level is undeniably essential, not only to ensure that subsequent processes go forward smoothly, but also to prevent failures induced by corrosive and hygroscopic contaminants. Ion Chromatography (IC) and ion equivalent measurement, also known as Resistivity of Solvent Extract test (ROSE test), are useful extracting methods for the assessment of the cleanliness of PCBAs. In both methods, the soluble contamination is transferred from the PCBA to the extracting medium. Then, the extracting medium is analysed accordingly for the cleanliness assessment.
In opposition to the ROSE-Test that only provides a rough numerical estimation of the ionic contamination, Ion Chromatography allows the identification and quantification of ions and weak organic acids. Thus, Ion Chromatography results enable a risk assessment regarding the sensitivity of the assembly to moisture.
The informative output of the Ion Chromatography depends strongly on the quality of the extraction. IPC has already established extraction parameters for the Ion Chromatography. The question that now arises is to know whether these parameters are also suitable for assemblies containing components with standoffs smaller than 30 µm.
In this presentation, the influence of temperature, time and proportion of isopropanol in the extraction medium will be enlightened. The aim of this presentation is herewith to obtain the optimum parameters for the extraction of ionic contaminants from narrow gaps, in order to achieve a reliable cleanliness control.
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