Introduction

Nov
14
2017

SEMICON forums > TechARENA > Metrology for Emerging Markets

14. Nov 2017
10:00-10:05 h  |  Hall B1 TechARENA2 / B1.171

Additional informations in detail view:
o Attachments
o Presscontact
o Alternative Events

Details

Subjects: 

SEMICON Europa

Type:
Lecture
Speech: English
Chair: Dr. Markus Pfeffer(Fraunhofer IISB, Manufacturing Control)

.

Location
Entrance North-West
C1
C2
C3
C4
Entrance North
B1
B2
B3
B4
B5
B6
A1
A2
A3
A4
A5
A6
ICM
B0
Entrance West
Entrance East
Nov
14
2017

SEMICON forums > TechARENA > Metrology for Emerging Markets

Next generation metrology obstacles will be overcome by MDM (Multi-Dimension Metrology)

14. Nov 2017
10:55-11:20 h  |  Hall B1 TechARENA2 / B1.171
Chair: Dr. Markus Pfeffer (Fraunhofer IISB, Manufacturing Control)

Additional informations in detail view:
o Attachments
o Presscontact
o Alternative Events

Details
Nov
14
2017

SEMICON forums > TechARENA > Metrology for Emerging Markets

FD-SOI film-thickness metrology

14. Nov 2017
12:10-12:35 h  |  Hall B1 TechARENA2 / B1.171
Chair: Dr. Markus Pfeffer (Fraunhofer IISB, Manufacturing Control)

Additional informations in detail view:
o Attachments
o Presscontact
o Alternative Events

Details
Nov
14
2017

SEMICON forums > TechARENA > Metrology for Emerging Markets

Nanoimaging and metrology of Nanopatterns under Opaque layers Using Subsurface Ultrasonic Resonance Force Microscopy

14. Nov 2017
10:30-10:55 h  |  Hall B1 TechARENA2 / B1.171
Chair: Dr. Markus Pfeffer (Fraunhofer IISB, Manufacturing Control)

Additional informations in detail view:
o Attachments
o Presscontact
o Alternative Events

Details
Nov
14
2017

SEMICON forums > TechARENA > Metrology for Emerging Markets

X-ray Metrology: Challenges and Solutions in the 3D era

14. Nov 2017
11:45-12:10 h  |  Hall B1 TechARENA2 / B1.171
Chair: Dr. Markus Pfeffer (Fraunhofer IISB, Manufacturing Control)

Additional informations in detail view:
o Attachments
o Presscontact
o Alternative Events

Details
Nov
14
2017

SEMICON forums > TechARENA > Metrology for Emerging Markets

Hybrid Metrology 2.0: From Metrology to Information Technology

14. Nov 2017
11:20-11:45 h  |  Hall B1 TechARENA2 / B1.171
Chair: Dr. Markus Pfeffer (Fraunhofer IISB, Manufacturing Control)

Additional informations in detail view:
o Attachments
o Presscontact
o Alternative Events

Details

 
 
 
  • productronica
 
Highlights
active active active
for exhibitors
for visitors
for the press
Final report

That was productronica 2017

Full halls, constructive discussions and positive feedback. Experience the highlights of the 2017 exhibition all over again.

Final report

That was productronica 2017

Full halls, constructive discussions and positive feedback. Experience the highlights of the 2017 exhibition all over again.

That was productronica 2017

Full halls, constructive discussions and positive feedback. Experience the highlights of the 2017 exhibition all over again.

Exhibition sectors

The entire market showcases itself here

The only trade fair that depicts the entire value chain in electronics manufacturing.

Exhibition sectors

The entire market showcases itself here

The only trade fair that depicts the entire value chain in electronics manufacturing.

The entire market showcases itself here

The only trade fair that depicts the entire value chain in electronics manufacturing.

News

News

News